labram hr800 evolution Search Results


confocal raman microscopy system  (Oxford Instruments)
99
Oxford Instruments confocal raman microscopy system
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
Confocal Raman Microscopy System, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/alpha300/pm39794636-250-11-15
Average 99 stars, based on 1 article reviews
confocal raman microscopy system - by Bioz Stars, 2026-09
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none 7 renishaw invia  (Renishaw Inc)
86
Renishaw Inc none 7 renishaw invia
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
None 7 Renishaw Invia, supplied by Renishaw Inc, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/invia+renishaw+system/10__1002_slash_jrs__70054-101-83-85
Average 86 stars, based on 1 article reviews
none 7 renishaw invia - by Bioz Stars, 2026-09
86/100 stars
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princeton instruments acton sp2500  (Princeton Instruments)
86
Princeton Instruments princeton instruments acton sp2500
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
Princeton Instruments Acton Sp2500, supplied by Princeton Instruments, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/acton+sp2500+spectrometer/10__1002_slash_jrs__70054-101-51-51
Average 86 stars, based on 1 article reviews
princeton instruments acton sp2500 - by Bioz Stars, 2026-09
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x ray diffraction  (Bruker Corporation)
99
Bruker Corporation x ray diffraction
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
X Ray Diffraction, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/D8+ADVANCE/10__1002_slash_rar2__70026-40-7-11
Average 99 stars, based on 1 article reviews
x ray diffraction - by Bioz Stars, 2026-09
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su8600  (Hitachi Ltd)
99
Hitachi Ltd su8600
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
Su8600, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/SU8600/custom%40su8600%4010420955
Average 99 stars, based on 1 article reviews
su8600 - by Bioz Stars, 2026-09
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high resolution transmission electron microscope  (JEOL)
99
JEOL high resolution transmission electron microscope
Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, <t>Raman</t> mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the
High Resolution Transmission Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/labram+hr800+evolution/JEOL-IDES_Products+Transmission+Electron+Microscope/10__1155_slash_2012_slash_475417-54-21-26
Average 99 stars, based on 1 article reviews
high resolution transmission electron microscope - by Bioz Stars, 2026-09
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Image Search Results


Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, Raman mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the

Journal: Nature materials

Article Title: Two-dimensional Czochralski growth of single-crystal MoS 2 .

doi: 10.1038/s41563-024-02069-7

Figure Lengend Snippet: Fig. 4 | Characterization of uniformity and crystal quality of MoS2. a, Raman mapping showing peak difference (between E1 2g and A1g) of the transferred MoS2 film; the black line scratched by a tweezer is marked for comparison. Scale bar, 500 μm. b, Statistical distribution of the Raman peak difference from mapping zones (4,000 Raman spectra). c, Raman line scan contour map covering a centimetre length range. d, Photograph of a two-inch MoS2 wafer. e, PL mapping patterns of MoS2 at positions marked in d. Scale bar, 10 μm. f, LEED patterns of a MoS2 domain over an area of approximately 6 × 6 mm2, taken at 80 eV, with the

Article Snippet: The PL and Raman spectra are measured in air using a confocal Raman microscopy system (WITec alpha300R, Horiba Jobin Yvon HR800, LabRAM HR Evolution) with an excitation wavelength of 532 nm and a laser spot of 2 μm.

Techniques: Comparison